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Leone AR, Tuohy MM, Snyder ME. Electron Microscopic Irregularities Resulting from Post-manufacture Modifications
to Intraocular Lenses. J Cataract Refract Surg 2025 Aug 13. doi: 10.1097/j.jcrs.0000000000001762.
PMID: 40797294
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Leone AR, Tuohy MM, Snyder ME. Electron Microscopic Irregularities Resulting from Post-manufacture Modifications
to Intraocular Lenses. J Cataract Refract Surg 2025 Aug 13. doi: 10.1097/j.jcrs.0000000000001762.
PMID: 40797294
|
|
|
|