Twice reflected ultrasonic bulk wave for surface defect monitoring. Wong VK, Li X, Yousry YM, Philibert M, et al. Ultrasonics 2024;147:107530.

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Wong VK, Li X, Yousry YM, Philibert M, et al. Twice reflected ultrasonic bulk wave for surface defect monitoring. Ultrasonics 2024;147:107530.
PMID: 39612893