Progression of Device-Detected Atrial High-Rate Episodes and the Risk of All-Cause Mortality. Jiang J, Sun X, Cheng C, Chen K, et al. Am J Cardiol 2023;204:96-103.

Read + Share

Amedeo Smart

Independent Medical Education

Read + Share

Jiang J, Sun X, Cheng C, Chen K, et al. Progression of Device-Detected Atrial High-Rate Episodes and the Risk of All-Cause Mortality. Am J Cardiol 2023;204:96-103.
PMID: 37541154